MIT Department of Electrical Engineering & Computer Science

E E C S

A Fast Coulomb-Blockade Electrometer: Towards the Dynamics of Individual Charges in Nanostructures

Dr. Robert J. Schoelkopf
Yale University

Wednesday, April 1, 1998
4:00 PM (refreshments 3:45)
Grier Room, Room 34-101A
EECS Special Seminar

Abstract

We describe a new type of electrometer using a single-electron transistor (SET) which allows large operating speeds and extremely high charge sensitivity. In this "RF-SET," the charge state of a small conductor is measured by observing the change in damping of a microwave resonator in which the SET is embedded, and thus it resembles the electrostatic "dual" of the well-known RF-SQUID. The bandwidth of this RF-SET is greater than 100 MHz, and the charge sensitivity is the best reported for any electrometer, corresponding to less than 15 micro-electrons per root Hertz. The combination of speed and sensitivity means that rapid single-electron counting, and the monitoring of transport processes at the level of individual charges, is now possible. A selection of the problems in solid-state physics and scientific instrumentation which are being addressed with this technique will be discussed.


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